2017 13th IEEE International Conference on

Electronic Measurement & InstrumentsICEMI2017

Yangzhou China

10.20-23, 2017

International Conference on Electronic Measurement & Instruments (ICEMI) is the world’s premier conference dedicated to the electronic test of devices, boards and systems----covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement, and is convened every two years. The purpose of the ICEMI is to provide excellent opportunities for scientists, engineers, and participants throughout the world to present the latest research results and to exchange their views or experience.

Sponsor:    

IEEE Beijing Section 

China Instrument and Control Society

Patrons: 

National Natural Science Foundation of China  

Organizers:          

Measurement and Instrument Committee of CIS

Yangzhou University

Chinese Journal of Scientific Instrument

Journal of Electronic Measurement and Instrumentation

Instrumentation

Network Support:

www.icemi.cn

www.etmchina.com

Announcement and Call for Papers

The 13th International Conference on Electronic Measurement & Instruments (ICEMI) will be held on 15-17 October, 2017, in Yangzhou, China. Prospective authors are invited to submit  original, unpublished papers describing recent work in any of the following areas but are not limited to:

 Measurement & Test Information Acquisition and Transmission

?/span>       Sensors and Transducers

?/span>       Non-electric Measurement

?/span>       Sensor Network

?/span>       Data Acquisition System and Technology

?/span>       Signal Transmission and Data Bus

?/span>       Networks in Test and Measurement

?/span>       IOT: Internet of Things

?/span>       Cyber Physical System

√ Measurement & Test Information Processing

?/span>       Sensors Fusion

?/span>       Signal Analysis and Processing

?/span>       Image Processing

?/span>       Measurement System and Theory

?/span>       Measurement Error Theory

?/span>       Virtual Measurement

?/span>       Machine Learning and Pattern Recognition

?/span>       Intelligent Optimization and Applications

?/span>       Data Mining

?/span>       Massive Data Management and Analysis

?/span>       Modeling and Simulation

?/span>       Reconfigurable Computing

  Measurement, Instruments & Test

?/span>       Virtual Instrument

?/span>       Microprocessor and Embedded System

?/span>       VLSI Testing and Fault Diagnosis

?/span>       MEMS Instruments and Test System

?/span>       Testability and Built-in-test

?/span>       Electronic Instrument & Measurement System

?/span>       Optical Instrument & Measurement System

?/span>       Precision Instruments & Measurement System

?/span>       Scientific Experiment and Analytic Instrument

?/span>       Educational Instrument & Experimental System

  Software Technology

?/span>       Embedded System Software

?/span>       Test System Software

?/span>       Software Test and Reliability

  Condition Monitoring and Health Management

?/span>       System Condition Monitoring

?/span>       Component and System Reliability

?/span>       Component and System Fault Diagnosis

?/span>       Prognostics and Health Management

?/span>       System Health Management

  Calibration and Traceability

?/span>       Quantum standards to fundamental constants and the international system of units

?/span>       DC/Low Frequency measurement standards and calibration set

?/span>       High Frequency measurement standards and calibration set

?/span>       Calibration for electromagnetic properties of materials

?/span>       Uncertainty evaluation

?/span>       International or regional comparison

  Instrument & Measurement in Research & Engineering

?/span>       Simulation and Experimental Technology

?/span>       Physical, Chemical and Biological Field

?/span>       Material & Electro-mechanical Engineering

?/span>       Energy and Power Engineering

?/span>       Communication Technology

?/span>       Aerospace & Avionics & Navigation

?/span>       Automobile Engineering

?/span>       Environmental Engineering

?/span>       Biomedical Instrument and Application

?/span>       Bioassay

?/span>       Biometric

?/span>       Industrial Process Control

?/span>       Robots

?/span>       Safety Monitoring Instruments and Systems

  Others

Language

English will be the official language at the conference.

Submission Guideline

    Potential authors are invited to submit papers via the ICEMI2017 website http://www.icemi.cn/ . It must be prepared according to the paper preparation guidelines provided on the website. Please check the website for more detailed instructions. The papers will be reviewed by the Technical Program Committee of ICEMI’2017. The authors of accepted full-text papers will be obliged to guarantee that they register for the conference, pay registration fees, attend the conference, and present their papers. All the accepted papers will be published on IEEE Proceedings.

Important dates

Paper Submission Open December 1, 2016
Paper Submission Deadline July 30, 2017
Proceedings Published October 15, 2017

 

Papers and Proceedings

Final papers are usually no less than 6 pages and written in MS word. All final papers must strictly comply with the standard templates of IEEE, which is available on ICEMI’2017 website:http://www.icemi.cn/. All papers should be submitted via ICEMI website or E-mail (icemi@vip.163.com).

Contact Information:

Address: No.79, Beiheyan Street, Dongcheng District, Beijing, China. 100009

Editorial office of “Journal of Electronic Measurement and Instrumentation

Tel: 8610-84050563, 8610-64007711

E-mail: icemi@vip.163.com.

For more detail information, please visit ICEMI’2017 website: http://www.icemi.cn/